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A Product Line of
Diodes Incorporated
ZXLD1356/ ZXLD1356Q
Functional Block Diagram
D1
V IN
R S
L1
5
V IN
4
I SENSE
1
LX
5V
R1
C1
4.7 μ F
Voltage
regulator
-
+
0.2V
-
+
Low voltage
detector
MN
Adj
3
-
+
R4
50K
R5
20K
600KHz
R2
D1
1.25V
-
+
R3
Gnd
1.35V
2
Figure 1. Block Diagram – Pin Connections Shown for TSOT25 Package
Absolute Maximum Ratings (Voltages to GND, unless otherwise specified.)
Symbol
V IN
V SENSE
V LX
V ADJ
I LX
Input Voltage
I SENSE Voltage
LX Output Voltage
Adjust Pin Input Voltage
Switch Output Current
Parameter
Rating
-0.3 to +60
(65V for 0.5 sec)
+0.3 to -5.0
(measured with respect to V IN )
-0.3 to +60
(65V for 0.5 sec)
-0.3 to +6.0
0.65
Unit
V
V
V
V
A
P TOT
T ST
T J MAX
Power Dissipation
(Refer to package thermal de-rating curve on page 25)
Storage Temperature
Junction Temperature
TSOT25
V-DFN3030-6
1
1.8
-55 to +150
150
W
°C
°C
These are stress ratings only. Operation outside the absolute maximum ratings may cause device failure.
Operation at the absolute maximum rating for extended periods may reduce device reliability.
ESD Susceptibility
Rating
Unit
Human Body Model
Charged Device Model
Machine Model
500
>1000
<100
V
V
V
Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling and
transporting these devices.
The human body model is a 100pF capacitor discharge through a 1.5k ? resistor pin. The machine model is a 200pF capacitor discharged directly into each pin.
ZXLD1356/ ZXLD1356Q
Document number: DS33470 Rev. 4 - 2
3 of 29
www.diodes.com
October 2012
? Diodes Incorporated
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